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TECHNICAL PAPERS

A Closure Model to Crack Growth Under Large-Scale Yielding and Through Residual Stress Fields

[+] Author and Article Information
C. H. Wang, S. A. Barter, Q. Liu

Aeronautical and Maritime Research Laboratory, Defence Science and Technology Organisation, 506 Lorimer Street, Fishermans Bend VIC 3207, Australia

J. Eng. Mater. Technol 125(2), 183-190 (Apr 04, 2003) (8 pages) doi:10.1115/1.1493804 History: Received July 11, 2001; Revised October 24, 2001; Online April 04, 2003
Copyright © 2003 by ASME
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References

Figures

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Fatigue results of specimens with three different surface treatments: mechanical polishing, chemical etching, and shot peening
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(a) Fracture surfaces of (a) an unpeened specimen and (b) a shot-peened specimen
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Fatigue crack growth curves of un-peened and shot peened specimens
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Residual stress distribution near shot-peened surface (a) stress state and coordinate system, and (b) residual compressive stress due to glass beads shot peening
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Relaxation of residual stress due to compressive underloads; (a) stress distributions near specimen surface, and (b) the maximum residual stress at specimen surface after relaxation
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Variation of normalized crack-tip opening displacement for plane-strain crack and axisymmetric crack
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Fatigue crack growth properties of 7050-T74511 aluminum alloy
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Crack-tip parameters: (a) residual plastic stretch for a plane-strain crack; (b) cyclic crack-tip opening displacement; and (c) a semi-elliptical surface crack emanating from a void
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(a) Influence of the initial flaw height on fatigue life, and (b) Comparison of predictions with experimental data of etched specimens (not shot-peened)
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Crack growth curves at three stress levels (a) peak stress=420 MPa, (b) peak stress=360 MPa, and (c) peak stress=270 MPa
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(a) Surface defect due to shot-peening and (b) a semi-elliptical surface crack showing upper bound and the lower bound
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Geometry factors for a semi-circular crack embedded in a residual stress field
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Comparisons of experimental data and predictions of crack length curves at two stress levels: (a) peak stress equals 420 MPa and (b) peak stress equals 360 MPa
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Comparisons of fatigue endurance curves under spectrum loading for shot-peened specimens

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