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TECHNICAL PAPERS

Influence of Carbon Content in Cobalt-Based Superalloys on Mechanical and Wear Properties

[+] Author and Article Information
Rong Liu

Department of Mechanical and Aerospace Engineering, Carleton University, 1125 Colonel By Drive, Ottawa, Ontario, Canada K1S 5B6

Matthew X. Yao

Deloro Stellite Inc., Belleville, Ontario, Canada K8N 5C4

Xijia Wu

Institute for Aerospace Research, National Research Council of Canada, Ottawa, Ontario, Canada K1A 0R6

J. Eng. Mater. Technol 126(2), 204-212 (Mar 18, 2004) (9 pages) doi:10.1115/1.1651096 History: Received August 05, 2003; Revised December 15, 2003; Online March 18, 2004
Copyright © 2004 by ASME
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References

Figures

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DSC heating/cooling cycle
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Schematic drawing of sliding wear on a pin-on-disc tribometer
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DSC heating and cooling curves: (a) LC sample and (b) HC sample
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The X-ray diffraction pattern of the LC and HC samples
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Optical microstructures: (a) LC sample (100X), (b) HC sample (100X), (c) LC sample (500X), and (d) HC sample (500X).
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Stress-strain curves of tensile testing: (a) LC sample and (b) HC sample
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Comparison of the 0.01% proof stress between the LC sample and the HC sample
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Comparison of ductility between the LC sample and the HC sample: (a) fracture stress and (b) fracture strain
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SEM images of fractured surfaces under tensile testing: (a) LC sample in low magnification, (b) HC sample in low magnification, (c) LC sample in high magnification, and (d) HC sample in high magnification
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Comparison of S-N curves in rotating-bending fatigue testing between the LC sample and the HC sample
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SEM images of fractured surfaces under rotating-bending fatigue testing: (a) LC sample in low magnification, (b) HC sample in low magnification, (c) LC sample in high magnification, and (d) HC sample in high magnification.
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Cross-sectional profiles of the wear tracks: (a) LC sample and (b) HC sample.
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Cross-sectional profiles of the wear tracks: (a) LC sample and (b) HC sample.
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SEM images of worn surfaces under pin-on-disc wear testing: (a) LC sample in low magnification, (b) HC sample in low magnification, (c) LC sample in high magnification, and (d) HC sample in high magnification.

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